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Improvement of Magnetic Force Microscope Resolution and Application to High-Density Recording Media
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Description
Magnetic force microscope (MFM) tips are prepared by coating magnetic materials on nonmagnetic Si tips with 4 nm radius. The effects of magnetic material and coating thickness on the MFM resolution and the switching field are investigated. MFM resolutions better than 8 nm have been confirmed with tips coated with soft magnetic or hard magnetic materials with optimized thicknesses. The switching field varies in a wide range 0.1-3.0 kOe depending on the coating material and the coating thickness (10-80 nm). High-resolution MFM tips are applied to the observations of magnetization structures of perpendicular and bit-patterned media samples. Magnetization structures of less than 20 nm in scale are clearly observed.
Journal
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- IEEE Transactions on Magnetics
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IEEE Transactions on Magnetics 49 (6), 2748-2754, 2013-06
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360848660342794368
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- ISSN
- 19410069
- 00189464
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- Article Type
- journal article
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- Data Source
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- Crossref
- KAKEN
- OpenAIRE