著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Chun-Hway Hsueh and Edwin R Fuller,Residual stresses in thermal barrier coatings: effects of interface asperity curvature/height and oxide thickness,Materials Science and Engineering: A,0921-5093,Elsevier BV,2000-05,283,1-2,46-55,https://cir.nii.ac.jp/crid/1360855570934018688,https://doi.org/10.1016/s0921-5093(00)00743-7