著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Shuochen Su and Felix Heide and Robin Swanson and Jonathan Klein and Clara Callenberg and Matthias Hullin and Wolfgang Heidrich,Material Classification Using Raw Time-of-Flight Measurements,2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),,IEEE,2016-06,,,3503-3511,https://cir.nii.ac.jp/crid/1360857612929461120,https://doi.org/10.1109/cvpr.2016.381