{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1360861709968272000.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1081/al-200056171"}},{"identifier":{"@type":"URI","@value":"http://www.tandfonline.com/doi/pdf/10.1081/AL-200056171"}}],"dc:title":[{"@value":"From Quartz Crystal Microbalance to Fundamental Principles of Mass Measurements"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380861709968272000","@type":"Researcher","foaf:name":[{"@value":"Vasile Mihai Mecea"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00032719"},{"@type":"EISSN","@value":"1532236X"}],"prism:publicationName":[{"@value":"Analytical Letters"}],"dc:publisher":[{"@value":"Informa UK Limited"}],"prism:publicationDate":"2005-03","prism:volume":"38","prism:number":"5","prism:startingPage":"753","prism:endingPage":"767"},"reviewed":"false","url":[{"@id":"http://www.tandfonline.com/doi/pdf/10.1081/AL-200056171"}],"createdAt":"2011-09-14","modifiedAt":"2025-03-10","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360011145363758336","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Advanced Nanoporous Material–Based QCM Devices: A New Horizon of Interfacial Mass Sensing Technology"}]},{"@id":"https://cir.nii.ac.jp/crid/1360021391888072448","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Scanning time-resolved measurement of transient lattice strain on quartz oscillators resonating under alternating electric field"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1081/al-200056171"},{"@type":"CROSSREF","@value":"10.1002/admi.201900849_references_DOI_Iq6NWMfn4FUCZ2c29rLfBGq2Nix"},{"@type":"CROSSREF","@value":"10.35848/1347-4065/acf475_references_DOI_Iq6NWMfn4FUCZ2c29rLfBGq2Nix"}]}