著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
R.K. Ratnesh and A. Goel and G. Kaushik and H. Garg and Chandan and M. Singh and B. Prasad,Advancement and challenges in MOSFET scaling,Materials Science in Semiconductor Processing,1369-8001,Elsevier BV,2021-11,134,,106002,https://cir.nii.ac.jp/crid/1360861711985378816,https://doi.org/10.1016/j.mssp.2021.106002