Micro knife-edge optical measurement device in a silicon-on-insulator substrate

Details 詳細情報について

• CRID

  1360861714473378944

• DOI

  10.1364/oe.15.006367

• ISSN

  10944087

• Web Site

  https://www.osapublishing.org/viewmedia.cfm?URI=oe-15-10-6367&seq=0

• Data Source

  • Crossref