Investigation of defects in BaSi2 thin film on Si prepared by co-sputtering technique

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Published
2024-11
Resource Type
journal article
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  • https://www.elsevier.com/tdm/userlicense/1.0/
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  • https://doi.org/10.15223/policy-017
  • https://doi.org/10.15223/policy-037
  • https://doi.org/10.15223/policy-012
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DOI
  • 10.1016/j.jlumin.2024.120797
Publisher
Elsevier BV

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