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Investigation of defects in BaSi2 thin film on Si prepared by co-sputtering technique
Bibliographic Information
- Published
- 2024-11
- Resource Type
- journal article
- Rights Information
-
- https://www.elsevier.com/tdm/userlicense/1.0/
- https://www.elsevier.com/legal/tdmrep-license
- https://doi.org/10.15223/policy-017
- https://doi.org/10.15223/policy-037
- https://doi.org/10.15223/policy-012
- https://doi.org/10.15223/policy-029
- https://doi.org/10.15223/policy-004
- DOI
-
- 10.1016/j.jlumin.2024.120797
- Publisher
- Elsevier BV
Search this article
Journal
-
- Journal of Luminescence
-
Journal of Luminescence 275 120797-, 2024-11
Elsevier BV
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Details 詳細情報について
-
- CRID
- 1360869855558496512
-
- ISSN
- 00222313
-
- Article Type
- journal article
-
- Data Source
-
- Crossref
- KAKEN
