Evaluation of Thermal Stress of N-type β-Ga<sub>2</sub>O<sub>3</sub> Crystals with Ti/Au Electrode Film by Micro-Raman Spectroscopy
書誌事項
- 公開日
- 2024-09-03
- 資源種別
- journal article
- DOI
-
- 10.7567/ssdm.2024.ps-04-04
- 公開者
- The Japan Society of Applied Physics
収録刊行物
-
- Extended Abstracts of the 2024 International Conference on Solid State Devices and Materials
-
Extended Abstracts of the 2024 International Conference on Solid State Devices and Materials 2024-09-03
The Japan Society of Applied Physics
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1360869855582392832
-
- 資料種別
- journal article
-
- データソース種別
-
- Crossref
- KAKEN
