著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Seokhan Kim and Jihoon Na and Myoung Jin Kim and Byeong Ha Lee,Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics,Optics Express,1094-4087,Optica Publishing Group,2008-04-04,16,8,5516,https://cir.nii.ac.jp/crid/1361137043968375168,https://doi.org/10.1364/oe.16.005516