著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
K. Shao and A. Morisset and V. Pouget and E. Faraud and C. Larue and D. Lewis and D. McMorrow,3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing,Optics Express,1094-4087,Optica Publishing Group,2011-10-25,19,23,22594,https://cir.nii.ac.jp/crid/1361137044001712384,https://doi.org/10.1364/oe.19.022594