3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing
Journal
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- Optics Express
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Optics Express 19 (23), 22594-, 2011-10-25
Optica Publishing Group
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Details 詳細情報について
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- CRID
- 1361137044001712384
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- ISSN
- 10944087
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- Data Source
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- Crossref