著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
P. J. McWhorter and P. S. Winokur,Simple technique for separating the effects of interface traps and trapped-oxide charge in metal-oxide-semiconductor transistors,Applied Physics Letters,0003-6951,AIP Publishing,1986-01-13,48,2,133-135,https://cir.nii.ac.jp/crid/1361137044917891712,https://doi.org/10.1063/1.96974