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This technique is applied to threshold-voltage shifts on an n-channel transistor that result from ionizing radiation.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1381137044917891712","@type":"Researcher","foaf:name":[{"@value":"P. J. McWhorter"}],"jpcoar:affiliationName":[{"@value":"Sandia National Laboratories, Albuquerque, New Mexico 87185"}]},{"@id":"https://cir.nii.ac.jp/crid/1381137044917891713","@type":"Researcher","foaf:name":[{"@value":"P. S. 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