Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Eishi Ibe and Sung Chung and Shijie Wen and Hironaru Yamaguchi and Yasuo Yahagi and Hideaki Kameyama and Shigehisa Yamamoto and Takashi Akioka,Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling,IEEE Custom Integrated Circuits Conference 2006,,IEEE,2006-09,,,437-444,https://cir.nii.ac.jp/crid/1361137045310465408,https://doi.org/10.1109/cicc.2006.321010