著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. Pisarek and M. Lewandowska and A. Roguska and K.J. Kurzydłowski and M. Janik-Czachor,"SEM, Scanning Auger and XPS characterization of chemically pretreated Ti surfaces intended for biomedical applications",Materials Chemistry and Physics,0254-0584,Elsevier BV,2007-07,104,1,93-97,https://cir.nii.ac.jp/crid/1361137045677758080,https://doi.org/10.1016/j.matchemphys.2007.02.088