著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
H.R. Zeller,Cosmic ray induced failures in high power semiconductor devices,Microelectronics Reliability,0026-2714,Elsevier BV,1997-10,37,10-11,1711-1718,https://cir.nii.ac.jp/crid/1361137046399050624,https://doi.org/10.1016/s0026-2714(97)00146-7