著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
A. S. Hou and B. A. Nechay and F. Ho and D. M. Bloom,Scanning probe microscopy for testing ultrafast electronic devices,Optical and Quantum Electronics,0306-8919,Springer Science and Business Media LLC,1996-07,28,7,819-841,https://cir.nii.ac.jp/crid/1361418519177187968,https://doi.org/10.1007/bf00820151