著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Guangxi Hu and Jinglun Gu and Shuyan Hu and Ying Ding and Ran Liu and Ting-Ao Tang,A Unified Carrier-Transport Model for the Nanoscale Surrounding-Gate MOSFET Comprising Quantum–Mechanical Effects,IEEE Transactions on Electron Devices,0018-9383,Institute of Electrical and Electronics Engineers (IEEE),2011-07,58,7,1830-1836,https://cir.nii.ac.jp/crid/1361418519337197056,https://doi.org/10.1109/ted.2011.2136343