著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
J. J. Kopanski and M. Y. Afridi and S. Jeliazkov and W. Jiang and T. R. Walker and David G. Seiler and Alain C. Diebold and Robert McDonald and C. Michael Garner and Dan Herr and Rajinder P. Khosla and Erik M. Secula,Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere,AIP Conference Proceedings,0094-243X,AIP,2007,931,,530,https://cir.nii.ac.jp/crid/1361418519399731456,https://doi.org/10.1063/1.2799430