著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Maik Scheller and Kai Baaske and Martin Koch,Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination,Applied Physics Letters,0003-6951,AIP Publishing,2010-04-12,96,15,151112,https://cir.nii.ac.jp/crid/1361418519804327168,https://doi.org/10.1063/1.3402767