{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1361418519973597568.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1039/c6tc01431c"}},{"identifier":{"@type":"URI","@value":"http://pubs.rsc.org/en/content/articlepdf/2016/TC/C6TC01431C"}}],"dc:title":[{"@value":"Novel temperature stable high-ε<sub>r</sub>microwave dielectrics in the Bi<sub>2</sub>O<sub>3</sub>–TiO<sub>2</sub>–V<sub>2</sub>O<sub>5</sub>system"}],"description":[{"type":"abstract","notation":[{"@value":"<p>Temperature stable microwave dielectric ceramics were obtained for compositions with 0.45BiVO<sub>4</sub>–0.55TiO<sub>2</sub>sintered at 900 °C with<italic>ε</italic><sub>r</sub>∼ 86, a<italic>Q</italic><sub>f</sub>∼ 9500 GHz and TCF ∼ −8 ppm per °C. It is promising for both low temperature co-fired ceramic technology and dielectrically loaded micro-strip patch antennas substrates.</p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1381418519973597574","@type":"Researcher","foaf:name":[{"@value":"Di Zhou"}],"jpcoar:affiliationName":[{"@value":"Electronic Materials Research Laboratory"},{"@value":"Key Laboratory of the Ministry of Education & International Center for Dielectric Research"},{"@value":"Xi'an Jiaotong University"},{"@value":"Xi'an 710049"},{"@value":"China"}]},{"@id":"https://cir.nii.ac.jp/crid/1381418519973597572","@type":"Researcher","foaf:name":[{"@value":"Dan Guo"}],"jpcoar:affiliationName":[{"@value":"Electronic Materials Research Laboratory"},{"@value":"Key Laboratory of the Ministry of Education & International Center for Dielectric Research"},{"@value":"Xi'an Jiaotong University"},{"@value":"Xi'an 710049"},{"@value":"China"}]},{"@id":"https://cir.nii.ac.jp/crid/1381418519973597570","@type":"Researcher","foaf:name":[{"@value":"Wen-Bo Li"}],"jpcoar:affiliationName":[{"@value":"Electronic Materials Research Laboratory"},{"@value":"Key Laboratory of the Ministry of Education & International Center for Dielectric Research"},{"@value":"Xi'an Jiaotong University"},{"@value":"Xi'an 710049"},{"@value":"China"}]},{"@id":"https://cir.nii.ac.jp/crid/1381418519973597568","@type":"Researcher","foaf:name":[{"@value":"Li-Xia Pang"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering"},{"@value":"University of Sheffield"},{"@value":"UK"},{"@value":"Micro-optoelectronic Systems Laboratories"},{"@value":"Xi'an Technological University"}]},{"@id":"https://cir.nii.ac.jp/crid/1381418519973597573","@type":"Researcher","foaf:name":[{"@value":"Xi Yao"}],"jpcoar:affiliationName":[{"@value":"Electronic Materials Research Laboratory"},{"@value":"Key Laboratory of the Ministry of Education & International Center for Dielectric Research"},{"@value":"Xi'an Jiaotong University"},{"@value":"Xi'an 710049"},{"@value":"China"}]},{"@id":"https://cir.nii.ac.jp/crid/1381418519973597571","@type":"Researcher","foaf:name":[{"@value":"Da-Wei Wang"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering"},{"@value":"University of Sheffield"},{"@value":"UK"}]},{"@id":"https://cir.nii.ac.jp/crid/1381418519973597569","@type":"Researcher","foaf:name":[{"@value":"Ian M. Reaney"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering"},{"@value":"University of Sheffield"},{"@value":"UK"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"20507526"},{"@type":"EISSN","@value":"20507534"}],"prism:publicationName":[{"@value":"Journal of Materials Chemistry C"}],"dc:publisher":[{"@value":"Royal Society of Chemistry (RSC)"}],"prism:publicationDate":"2016","prism:volume":"4","prism:number":"23","prism:startingPage":"5357","prism:endingPage":"5362"},"reviewed":"false","url":[{"@id":"http://pubs.rsc.org/en/content/articlepdf/2016/TC/C6TC01431C"}],"createdAt":"2016-05-10","modifiedAt":"2024-06-16","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1390564237989222912","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Microwave dielectric properties and microstructure of (Li<sub>2</sub>Zn<sub>3−</sub><i><sub>x</sub></i>Ti<sub>4−</sub><i><sub>x</sub></i>O<sub>12−3</sub><i><sub>x</sub></i>)–<i>x</i>CaTiO<sub>3</sub> ceramics (<i>x</i> = 0 to 0.32)"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1039/c6tc01431c"},{"@type":"CROSSREF","@value":"10.2109/jcersj2.17146_references_DOI_WoFY7r1p3dUg7PqZ4QrMbUhmMgD"}]}