著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Dong Xiang and Shan Gu and Jia-Guang Sun and Yu-liang Wu,A cost-effective scan architecture for scan testing with non-scan test power and test application cost,Proceedings of the 40th conference on Design automation - DAC '03,,ACM Press,2003,,,,https://cir.nii.ac.jp/crid/1361418520200033536,https://doi.org/10.1145/776019.776022