{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1361699994792372480.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1126/science.1158573"}},{"identifier":{"@type":"URI","@value":"https://www.science.org/doi/pdf/10.1126/science.1158573"}}],"dc:title":[{"@value":"High-Resolution Scanning X-ray Diffraction Microscopy"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1381699994792372481","@type":"Researcher","foaf:name":[{"@value":"Pierre Thibault"}],"jpcoar:affiliationName":[{"@value":"Paul Scherrer Institut, 5232 Villigen PSI, Switzerland."},{"@value":"École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland."}]},{"@id":"https://cir.nii.ac.jp/crid/1381699994792372480","@type":"Researcher","foaf:name":[{"@value":"Martin Dierolf"}],"jpcoar:affiliationName":[{"@value":"Paul Scherrer Institut, 5232 Villigen PSI, Switzerland."},{"@value":"École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland."}]},{"@id":"https://cir.nii.ac.jp/crid/1381699994792372483","@type":"Researcher","foaf:name":[{"@value":"Andreas Menzel"}],"jpcoar:affiliationName":[{"@value":"Paul Scherrer Institut, 5232 Villigen PSI, Switzerland."},{"@value":"École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland."}]},{"@id":"https://cir.nii.ac.jp/crid/1381699994792372484","@type":"Researcher","foaf:name":[{"@value":"Oliver Bunk"}],"jpcoar:affiliationName":[{"@value":"Paul Scherrer Institut, 5232 Villigen PSI, Switzerland."},{"@value":"École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland."}]},{"@id":"https://cir.nii.ac.jp/crid/1381699994792372482","@type":"Researcher","foaf:name":[{"@value":"Christian David"}],"jpcoar:affiliationName":[{"@value":"Paul Scherrer Institut, 5232 Villigen PSI, Switzerland."},{"@value":"École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland."}]},{"@id":"https://cir.nii.ac.jp/crid/1381699994792372485","@type":"Researcher","foaf:name":[{"@value":"Franz Pfeiffer"}],"jpcoar:affiliationName":[{"@value":"Paul Scherrer Institut, 5232 Villigen PSI, Switzerland."},{"@value":"École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland."}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00368075"},{"@type":"EISSN","@value":"10959203"}],"prism:publicationName":[{"@value":"Science"}],"dc:publisher":[{"@value":"American Association for the Advancement of Science (AAAS)"}],"prism:publicationDate":"2008-07-18","prism:volume":"321","prism:number":"5887","prism:startingPage":"379","prism:endingPage":"382"},"reviewed":"false","url":[{"@id":"https://www.science.org/doi/pdf/10.1126/science.1158573"}],"createdAt":"2008-07-17","modifiedAt":"2024-01-10","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1050005987757581184","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Nanoscale determination of interatomic distance by ptychography-EXAFS method using advanced Kirkpatrick–Baez mirror focusing 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