著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Immanuel Raja and Gaurab Banerjee and Mohamad A. Zeidan and Jacob A. Abraham,A 0.1–3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS,IEEE Transactions on Very Large Scale Integration (VLSI) Systems,1063-8210,Institute of Electrical and Electronics Engineers (IEEE),2016-05,24,5,1975-1983,https://cir.nii.ac.jp/crid/1361699995132436480,https://doi.org/10.1109/tvlsi.2015.2478804