Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
S. K. Pradhan and M. De,An x-ray diffraction line profile analysis on the microstructure of cold-worked face-centered-cubic Cu-Mn-Si alloys: Effects of Mn and Si as solutes,Journal of Applied Physics,0021-8979,AIP Publishing,1988-09-01,64,5,2324-2327,https://cir.nii.ac.jp/crid/1361699995787872256,https://doi.org/10.1063/1.341662