{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1361699996131271296.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1117/12.284534"}}],"dc:title":[{"@value":"Tensile testing of thin-film microstructures"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1381699996131271296","@type":"Researcher","foaf:name":[{"@value":"Staffan Greek"}]},{"@id":"https://cir.nii.ac.jp/crid/1381699996131271299","@type":"Researcher","foaf:name":[{"@value":"Stefan A. I. Johansson"}]}],"contributor":[{"@id":"https://cir.nii.ac.jp/crid/1381699996131271297","@type":"Researcher","foaf:name":[{"@value":"Kevin H. Chau"}],"role":"editor"},{"@id":"https://cir.nii.ac.jp/crid/1381699996131271298","@type":"Researcher","foaf:name":[{"@value":"Patrick J. French"}],"role":"editor"}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"0277786X"}],"prism:publicationName":[{"@value":"SPIE Proceedings"}],"dc:publisher":[{"@value":"SPIE"}],"prism:publicationDate":"1997-09-05","prism:volume":"3224","prism:startingPage":"344"},"reviewed":"false","createdAt":"2004-08-31","modifiedAt":"2016-08-03","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1390001205264237568","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Reliability Assessment of Advanced Materials and Structures"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1117/12.284534"},{"@type":"CROSSREF","@value":"10.1299/jmmp.4.639_references_DOI_HvLTAM6oUc0zxoUiNgPiopBEXU0"}]}