{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1361699996452236288.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.3390/coatings6040054"}},{"identifier":{"@type":"URI","@value":"https://www.mdpi.com/2079-6412/6/4/54/pdf"}}],"dc:title":[{"@value":"Introduction to Advanced X-ray Diffraction Techniques for Polymeric Thin Films"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>X-ray diffraction has been a standard technique for investigating structural properties of materials. However, most common applications in the organic materials community have been restricted to either chemical identification or qualitative strain analysis. Moreover, its use for polymeric thin films has been challenging because of the low structure factor of carbon and the thin film nature of the sample. Here, we provide a short review of advanced X-ray diffraction (XRD) techniques suitable for polymeric thin films, including the type of analysis that can be done and measurement geometries that would compensate low signals due to low carbon structure factor and the thin film nature of the sample. We will also briefly cover the    χ   -pole figure for texture analysis of ultra-thin film that has recently become commonly used. A brief review of XRD theory is also presented.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1381699996452236288","@type":"Researcher","foaf:name":[{"@value":"Nicodemus Widjonarko"}],"jpcoar:affiliationName":[{"@value":"Department of Physics, University of Colorado, Boulder, CO 80309, USA"}]}],"publication":{"publicationIdentifier":[{"@type":"EISSN","@value":"20796412"}],"prism:publicationName":[{"@value":"Coatings"}],"dc:publisher":[{"@value":"MDPI AG"}],"prism:publicationDate":"2016-11-01","prism:volume":"6","prism:number":"4","prism:startingPage":"54"},"reviewed":"false","dc:rights":["https://creativecommons.org/licenses/by/4.0/"],"url":[{"@id":"https://www.mdpi.com/2079-6412/6/4/54/pdf"}],"createdAt":"2016-11-01","modifiedAt":"2025-10-11","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1050570022166954112","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Alternative Face-on Thin Film Structure of Pentacene"}]},{"@id":"https://cir.nii.ac.jp/crid/1360857593798364416","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Investigation of the Mobility–Stretchability Properties of Naphthalenediimide-Based Conjugated Random Terpolymers with a Functionalized Conjugation Break Spacer"}]},{"@id":"https://cir.nii.ac.jp/crid/2050870367074851584","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"MAIRS : innovation of molecular orientation analysis in a thin film"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.3390/coatings6040054"},{"@type":"CROSSREF","@value":"10.1038/s41598-018-37166-6_references_DOI_A5QMMohh2BH2SRcSmNc7PRMtFLn"},{"@type":"CROSSREF","@value":"10.1246/bcsj.20200139_references_DOI_A5QMMohh2BH2SRcSmNc7PRMtFLn"},{"@type":"CROSSREF","@value":"10.1021/acs.macromol.1c00534_references_DOI_A5QMMohh2BH2SRcSmNc7PRMtFLn"}]}