著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Yu Cai and Saugata Ghose and Erich F. Haratsch and Yixin Luo and Onur Mutlu,"Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives",Proceedings of the IEEE,0018-9219,Institute of Electrical and Electronics Engineers (IEEE),2017-09,105,9,1666-1704,https://cir.nii.ac.jp/crid/1361981468541179904,https://doi.org/10.1109/jproc.2017.2713127