著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Rafał Wilk and Falk Breitfeld and Martin Mikulics and Martin Koch,Continuous wave terahertz spectrometer as a noncontact thickness measuring device,Applied Optics,0003-6935,Optica Publishing Group,2008-05-26,47,16,3023,https://cir.nii.ac.jp/crid/1361981469395402752,https://doi.org/10.1364/ao.47.003023