{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1361981470003974400.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1186/1477-3155-7-7"}}],"dc:title":[{"@value":"Backstep scanning ion conductance microscopy as a tool for long term investigation of single living cells"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1381981470003974401","@type":"Researcher","foaf:name":[{"@value":"Patrick Happel"}]},{"@id":"https://cir.nii.ac.jp/crid/1381981470003974400","@type":"Researcher","foaf:name":[{"@value":"Irmgard D Dietzel"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"14773155"}],"prism:publicationName":[{"@value":"Journal of Nanobiotechnology"}],"dc:publisher":[{"@value":"Springer Science and Business Media LLC"}],"prism:publicationDate":"2009","prism:volume":"7","prism:number":"1","prism:startingPage":"7"},"reviewed":"false","createdAt":"2009-10-27","modifiedAt":"2016-05-16","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360003449891806720","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Skewness of the height distribution in cell topography images is a measure of cell shape"}]},{"@id":"https://cir.nii.ac.jp/crid/1360004232372513280","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Scanning ion conductance microscopy for imaging biological samples in liquid: A comparative study with atomic force microscopy and scanning electron microscopy"}]},{"@id":"https://cir.nii.ac.jp/crid/1360284924867424384","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Dimensional comparison between amplitude-modulation atomic force microscopy and scanning ion conductance microscopy of biological samples"}]},{"@id":"https://cir.nii.ac.jp/crid/1360285707475556352","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Scanning ion conductance microscopy for visualizing the three-dimensional surface topography of cells and tissues"}]},{"@id":"https://cir.nii.ac.jp/crid/1360290617688299392","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Scanning ion-conductance microscopy with a double-barreled nanopipette for topographic imaging of charged chromosomes"}]},{"@id":"https://cir.nii.ac.jp/crid/1360572092665918464","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Scanning ion conductance microscopy of isolated metaphase chromosomes in a liquid environment"}]},{"@id":"https://cir.nii.ac.jp/crid/1360857593752122240","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Comparison of Scanning Ion-Conductance Microscopy with Scanning Electron Microscopy for Imaging the Surface Topography of Cells and Tissues"}]},{"@id":"https://cir.nii.ac.jp/crid/1361412892866848000","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"High-Speed SICM for the Visualization of Nanoscale Dynamic Structural Changes in Hippocampal Neurons"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1186/1477-3155-7-7"},{"@type":"CROSSREF","@value":"10.7567/jjap.57.08nb02_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.1021/acs.analchem.9b04775_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.1093/jmicro/dfab009_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.7567/jjap.55.08nb18_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.1007/s10577-021-09659-0_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.1007/11663_2021_11_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.1016/j.micron.2012.01.012_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"},{"@type":"CROSSREF","@value":"10.1016/j.semcdb.2017.09.024_references_DOI_2KjiTKPVcjO503oTB7uW7hPF3nL"}]}