著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Johannes Rheinlaender and Tilman E. Schäffer,"Image formation, resolution, and height measurement in scanning ion conductance microscopy",Journal of Applied Physics,0021-8979,AIP Publishing,2009-05-01,105,9,094905,https://cir.nii.ac.jp/crid/1361981470194428800,https://doi.org/10.1063/1.3122007