著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Jijun Xiong and Jianjun Tang and Ting Liang and Yong Wang and Chenyang Xue and Weili Shi and Wendong Zhang,Characterization of crystal lattice constant and dislocation density of crack-free GaN films grown on Si(111),Applied Surface Science,0169-4332,Elsevier BV,2010-12,257,4,1161-1165,https://cir.nii.ac.jp/crid/1361981471044094720,https://doi.org/10.1016/j.apsusc.2010.07.073