著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
F. Linke and R. Merkel,Quantitative ellipsometric microscopy at the silicon–air interface,Review of Scientific Instruments,0034-6748,AIP Publishing,2005-05-17,76,6,6,https://cir.nii.ac.jp/crid/1361981471204940032,https://doi.org/10.1063/1.1921547