著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
B. Swahn and Soha Hassoun,Gate sizing: finFETs vs 32nm bulk MOSFETs,2006 43rd ACM/IEEE Design Automation Conference,0738-100X,IEEE,2006,,,,https://cir.nii.ac.jp/crid/1361981471470878336,https://doi.org/10.1109/dac.2006.229286