著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Anil K. Jain and Yi Chen and Meltem Demirkus,Pores and Ridges: High-Resolution Fingerprint Matching Using Level 3 Features,IEEE Transactions on Pattern Analysis and Machine Intelligence,0162-8828,Institute of Electrical and Electronics Engineers (IEEE),2007-01,29,1,15-27,https://cir.nii.ac.jp/crid/1362262943563377152,https://doi.org/10.1109/tpami.2007.250596