著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
S. Roorda and W. C. Sinke and J. M. Poate and D. C. Jacobson and S. Dierker and B. S. Dennis and D. J. Eaglesham and F. Spaepen and P. Fuoss,Structural relaxation and defect annihilation in pure amorphous silicon,Physical Review B,0163-1829,American Physical Society (APS),1991-08-15,44,8,3702-3725,https://cir.nii.ac.jp/crid/1362262943741300736,https://doi.org/10.1103/physrevb.44.3702