{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1362262945383144192.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1063/1.2818102"}},{"identifier":{"@type":"URI","@value":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.2818102/15010530/116104_1_online.pdf"}}],"dc:title":[{"@value":"Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>The long distance behavior of the surface temperature wave in a thermoreflectance microscopy experiment is established for a conductive layer deposited on an insulating substrate. At large distance from the point source, heat is confined, so the amplitude decrease is lower than for a bulk sample. From the slopes which appear on the phase and on the log scale amplitude, a procedure is proposed to extract, separately, the thermal diffusivity and conductivity of the layer, taking into account data obtained at different modulation frequencies. Experimental results are presented which confirm the validity of the method.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1382262945383144195","@type":"Researcher","foaf:name":[{"@value":"Christian Frétigny"}],"jpcoar:affiliationName":[{"@value":"UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"},{"@value":"UPR A0005 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1382262945383144192","@type":"Researcher","foaf:name":[{"@value":"Jean Paul Roger"}],"jpcoar:affiliationName":[{"@value":"UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"},{"@value":"UPR A0005 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1382262945383144193","@type":"Researcher","foaf:name":[{"@value":"Valérie Reita"}],"jpcoar:affiliationName":[{"@value":"UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"},{"@value":"UPR A0005 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1382262945383144194","@type":"Researcher","foaf:name":[{"@value":"Danièle Fournier"}],"jpcoar:affiliationName":[{"@value":"UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"},{"@value":"UPR A0005 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00218979"},{"@type":"EISSN","@value":"10897550"}],"prism:publicationName":[{"@value":"Journal of Applied Physics"}],"dc:publisher":[{"@value":"AIP Publishing"}],"prism:publicationDate":"2007-12-01","prism:volume":"102","prism:number":"11"},"reviewed":"false","url":[{"@id":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.2818102/15010530/116104_1_online.pdf"}],"createdAt":"2007-12-05","modifiedAt":"2024-02-20","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360003449890004480","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Thermal property measurement of solder joints fabricated by self-propagating exothermic reaction in Al/Ni multilayer film"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.2818102"},{"@type":"CROSSREF","@value":"10.7567/jjap.54.06fp15_references_DOI_C4I2b2tgnvRyhsWE6Kn8ora3F8C"}]}