著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Takeshi Hasegawa,Advanced Multiple-Angle Incidence Resolution Spectrometry for Thin-Layer Analysis on a Low-Refractive-Index Substrate,Analytical Chemistry,0003-2700,American Chemical Society (ACS),2007-05-17,79,12,4385-4389,https://cir.nii.ac.jp/crid/1362262945485867136,https://doi.org/10.1021/ac070676d