著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
David F. Austin and Michael Lee,Detection of Quantitative Trait Loci for Grain Yield and Yield Components in Maize across Generations in Stress and Nonstress Environments,Crop Science,0011-183X,Wiley,1998-09,38,5,1296-1308,https://cir.nii.ac.jp/crid/1362262946143677952,https://doi.org/10.2135/cropsci1998.0011183x003800050029x