著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. A. Lantz and H. J. Hug and P. J. A. van Schendel and R. Hoffmann and S. Martin and A. Baratoff and A. Abdurixit and H.-J. Güntherodt and Ch. Gerber,"Low Temperature Scanning Force Microscopy of the<mml:math xmlns:mml=""http://www.w3.org/1998/Math/MathML"" display=""inline""><mml:mi>Si</mml:mi><mml:mo>(</mml:mo><mml:mn>111</mml:mn><mml:mo>)</mml:mo><mml:mi>−</mml:mi><mml:mo>(</mml:mo><mml:mn>7</mml:mn><mml:mo>×</mml:mo><mml:mn>7</mml:mn><mml:mo>)</mml:mo></mml:math>Surface",Physical Review Letters,0031-9007,American Physical Society (APS),2000-03-20,84,12,2642-2645,https://cir.nii.ac.jp/crid/1362544419600367232,https://doi.org/10.1103/physrevlett.84.2642