著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
J. L. Gavartin and D. Muñoz Ramo and A. L. Shluger and G. Bersuker and B. H. Lee,Negative oxygen vacancies in HfO2 as charge traps in high-k stacks,Applied Physics Letters,0003-6951,AIP Publishing,2006-08-21,89,8,082908,https://cir.nii.ac.jp/crid/1362544421360996864,https://doi.org/10.1063/1.2236466