著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
R. Hesse and P. Streubel and R. Szargan,"Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra",Surface and Interface Analysis,0142-2421,Wiley,2007-01-09,39,5,381-391,https://cir.nii.ac.jp/crid/1362825893366924416,https://doi.org/10.1002/sia.2527