著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Bin Nie and Lishan Yang and Adwait Jog and Evgenia Smirni,Fault Site Pruning for Practical Reliability Analysis of GPGPU Applications,2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO),,IEEE,2018-10,,,,https://cir.nii.ac.jp/crid/1362825894128330752,https://doi.org/10.1109/micro.2018.00066