著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Paul G. Kotula and Michael R. Keenan and Joseph R. Michael,Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool,Microscopy and Microanalysis,1431-9276,Oxford University Press (OUP),2003-01-31,9,1,1-17,https://cir.nii.ac.jp/crid/1362825894922014848,https://doi.org/10.1017/s1431927603030058