{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1362825895194386944.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.4236/msce.2015.38005"}},{"identifier":{"@type":"URI","@value":"https://www.scirp.org/journal/paperinformation?paperid=58656"}},{"identifier":{"@type":"URI","@value":"https://www.scirp.org/xml/58656.xml"}}],"dc:title":[{"@value":"Photoluminescence Properties of Europium and Cerium Co-Doped Tantalum-Oxide Thin Films Prepared Using Co-Sputtering Method"}],"description":[{"notation":[{"@value":"We fabricated europium and cerium co-doped tantalum (V) oxide (Ta2O5: Eu, Ce) thin films using  our co-sputtering method for the first time, and evaluated photoluminescence (PL) properties of  the films after annealing at 600°C - 1100°C for 20 min. Four remarkable PL peaks at wavelengths of  600, 620, 700, and 705 nm were observed from the film annealed at 900°C. The intensities of the  700- and 705-nm peaks due to the 5D0 → 7F4 transition of Eu3+ were much stronger than those of  the 600-nm (5D0 → 7F1) and 620-nm (5D0 → 7F2) peaks of the film annealed at 900°C. It seems that  energy transfer from Ce3+ to Eu3+ occurs in the film, and much energy is selectively used for the 5D0 →7F4 and 5D0 → 7F1 transitions. Such a Ta2O5: Eu, Ce co-sputtered thin film seems to be used as a  multi-functional coating film having both anti-reflection and down-conversion effects for realizing  a high-efficiency silicon solar cell."}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1382825895194386945","@type":"Researcher","foaf:name":[{"@value":"Kenta Miura"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895194386944","@type":"Researcher","foaf:name":[{"@value":"Tetsuhito Suzuki"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895194386946","@type":"Researcher","foaf:name":[{"@value":"Osamu Hanaizumi"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"23276045"},{"@type":"EISSN","@value":"23276053"}],"prism:publicationName":[{"@value":"Journal of Materials Science and Chemical Engineering"}],"dc:publisher":[{"@value":"Scientific Research Publishing, Inc."}],"prism:publicationDate":"2015","prism:volume":"03","prism:number":"08","prism:startingPage":"30","prism:endingPage":"34"},"reviewed":"false","dcterms:accessRights":"http://purl.org/coar/access_right/c_abf2","dc:rights":["http://creativecommons.org/licenses/by-nc/4.0/"],"url":[{"@id":"https://www.scirp.org/journal/paperinformation?paperid=58656"},{"@id":"https://www.scirp.org/xml/58656.xml"}],"createdAt":"2015-08-07","modifiedAt":"2026-03-12","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360567189937088512","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Photoluminescence and X-Ray Diffraction Properties of Europium and Silver Co-Doped Tantalum-Oxide Thin Films Deposited by Co-Sputtering"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.4236/msce.2015.38005"},{"@type":"OPENAIRE","@value":"doi_dedup___::9dc071dc7b4e1a17b49cc1299bd742cb"},{"@type":"CROSSREF","@value":"10.4236/msce.2017.52004_references_DOI_LL2s2YSnS0a2WlLPaWLbd5slSf7"}]}