{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1362825895990732032.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1016/j.nima.2013.04.063"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0168900213004841?httpAccept=text/xml"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0168900213004841?httpAccept=text/plain"}}],"dc:title":[{"@value":"Development and characterization of the latest X-ray SOI pixel sensor for a future astronomical mission"}],"description":[{"notation":[{"@value":"Abstract   We have been developing active pixel sensors based on silicon-on-insulator technology for future X-ray astronomy missions. Recently we fabricated the new prototype named “XRPIX2”, and investigated its spectroscopic performance. For comparison and evaluation of different chip designs, XRPIX2 consists of 3 pixel types: Small Pixel, Large Pixel 1, and Large Pixel 2. In Small Pixel, we found that the gains of the 68% pixels are within 1.4% of the mean value, and the energy resolution is 656 eV (FWHM) for 8 keV X-rays, which is the best spectroscopic performance in our development. The pixel pitch of Large Pixel 1 and Large Pixel 2 is twice as large as that of Small Pixel. Charge sharing events are successfully reduced for Large Pixel 1. Moreover Large Pixel 2 has multiple nodes for charge collection in a pixel. We confirmed that the multi-nodes structure is effective to increase charge collection efficiency."}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1382825895990732039","@type":"Researcher","foaf:name":[{"@value":"Shinya Nakashima"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990731904","@type":"Researcher","foaf:name":[{"@value":"Syukyo Gando Ryu"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732036","@type":"Researcher","foaf:name":[{"@value":"Takaaki Tanaka"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732038","@type":"Researcher","foaf:name":[{"@value":"Takeshi Go Tsuru"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732037","@type":"Researcher","foaf:name":[{"@value":"Ayaki Takeda"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732033","@type":"Researcher","foaf:name":[{"@value":"Yasuo Arai"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732034","@type":"Researcher","foaf:name":[{"@value":"Toshifumi Imamura"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732035","@type":"Researcher","foaf:name":[{"@value":"Takafumi Ohmoto"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825895990732032","@type":"Researcher","foaf:name":[{"@value":"Atsushi Iwata"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"01689002"}],"prism:publicationName":[{"@value":"Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment"}],"dc:publisher":[{"@value":"Elsevier BV"}],"prism:publicationDate":"2013-12","prism:volume":"731","prism:startingPage":"74","prism:endingPage":"78"},"reviewed":"false","dc:rights":["https://www.elsevier.com/tdm/userlicense/1.0/","https://www.elsevier.com/legal/tdmrep-license"],"url":[{"@id":"https://api.elsevier.com/content/article/PII:S0168900213004841?httpAccept=text/xml"},{"@id":"https://api.elsevier.com/content/article/PII:S0168900213004841?httpAccept=text/plain"}],"createdAt":"2013-05-09","modifiedAt":"2025-09-29","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360004235400933120","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Tradeoff Between Low-Power Operation and Radiation Hardness of Fully Depleted SOI pMOSFET by Changing LDD Conditions"}]},{"@id":"https://cir.nii.ac.jp/crid/1360285710855722880","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Development and performance of Kyoto's x-ray astronomical SOI pixel (SOIPIX) sensor"}]},{"@id":"https://cir.nii.ac.jp/crid/1360567182354599936","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Reduction of cross-talks between circuit and sensor layer in the Kyoto's X-ray astronomy SOI pixel sensors with Double-SOI wafer"}]},{"@id":"https://cir.nii.ac.jp/crid/1360567182354887552","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Performance of the Silicon-On-Insulator pixel sensor for X-ray astronomy, XRPIX6E, equipped with pinned depleted diode structure"}]},{"@id":"https://cir.nii.ac.jp/crid/1360567184404314368","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Improvement of spectroscopic performance using a charge-sensitive amplifier circuit for an X-ray astronomical SOI pixel detector"}]},{"@id":"https://cir.nii.ac.jp/crid/1360848657331064448","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Investigation of charge-collection efficiency of Kyoto׳s X-ray astronomical SOI pixel sensors, XRPIX"}]},{"@id":"https://cir.nii.ac.jp/crid/1360848657331310208","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"First results of a Double-SOI pixel chip for X-ray imaging"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1016/j.nima.2013.04.063"},{"@type":"OPENAIRE","@value":"doi_dedup___::688d9a418e94d99b7d6bd3ddf83ab8ee"},{"@type":"CROSSREF","@value":"10.1117/12.2057158_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"},{"@type":"CROSSREF","@value":"10.1016/j.nima.2016.04.022_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"},{"@type":"CROSSREF","@value":"10.1109/ted.2016.2552486_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"},{"@type":"CROSSREF","@value":"10.1088/1748-0221/10/06/c06005_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"},{"@type":"CROSSREF","@value":"10.1016/j.nima.2014.05.025_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"},{"@type":"CROSSREF","@value":"10.1016/j.nima.2016.04.024_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"},{"@type":"CROSSREF","@value":"10.1016/j.nima.2018.09.127_references_DOI_BNbXJIym1GVLjSpF6vX6m0WFdD8"}]}