{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1362825896203115136.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1063/1.4980111"}},{"identifier":{"@type":"URI","@value":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.4980111/13374356/153101_1_online.pdf"}},{"identifier":{"@type":"HANDLE","@value":"10281/192145"}}],"dc:title":[{"@value":"Cathodo-luminescence of color centers induced in sapphire and yttria-stabilized zirconia by high-energy electrons"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>We have studied the color-center production in sapphire and yttria-stabilized zirconia (YSZ) single crystals by cathodo-luminescence (CL) spectroscopy for electron energies ranging between 400 and 1250 keV in a high-voltage electron microscope. Emission spectra were collected for in-beam conditions near room temperature and at 200 K. Comparison was made with CL spectra recorded for 3-keV–20-keV electrons in a scanning electron microscope. For high-energy electrons, CL spectra for sapphire revealed broad emission bands centered at photon energies about 3.0 eV and 3.8 eV that were, respectively, assigned to oxygen vacancies (F0 and F+ centers) induced by elastic collisions, on the basis of photoluminescence (PL) data. No such bands were recorded for 3-keV and 5-keV electrons. Two similar bands were also recorded for YSZ (with 9.5 and 18 mol. % yttria) at about 2.8 eV and 4.1 eV that can be, respectively, attributed to the native oxygen vacancies (F2+ centers) and F+ centers. The 4.1-eV band was not seen for 20-keV electrons: it was only produced for high electron energies by elastic collision processes. Instead, the small side band was also found at 2.85 eV for 20-keV electrons. PL excitation contour plots of virgin and irradiated YSZ were also recorded to support our discussion on point-defect identification. CL band intensities show a maximum versus electron energy, whereas point-defect concentrations should increase due to the increase of oxygen atom displacement cross section. The effect of electron energy on the different steps of the CL process is discussed to account for such a behavior.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1382825896203115139","@type":"Researcher","foaf:name":[{"@value":"Jean-Marc Costantini"}],"jpcoar:affiliationName":[{"@value":"Université Paris-Saclay 1 DEN, Service de Recherches Métallurgiques Appliquées, CEA, , F-91191 Gif-sur Yvette Cedex, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825896203115137","@type":"Researcher","foaf:name":[{"@value":"Yasushi Watanabe"}],"jpcoar:affiliationName":[{"@value":"Kyushu University 2 Department of Applied Quantum Physics and Nuclear Engineering, , 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825896203115138","@type":"Researcher","foaf:name":[{"@value":"Kazuhiro Yasuda"}],"jpcoar:affiliationName":[{"@value":"Kyushu University 2 Department of Applied Quantum Physics and Nuclear Engineering, , 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan"}]},{"@id":"https://cir.nii.ac.jp/crid/1382825896203115136","@type":"Researcher","foaf:name":[{"@value":"Mauro Fasoli"}],"jpcoar:affiliationName":[{"@value":"Università degli Studi Milano-Bicocca 3 Dipartimento di Scienza dei Materiali, , via Cozzi 53, 20125 Milano, Italy"}]}],"contributor":[{"@id":"https://cir.nii.ac.jp/crid/1892835442535731337","@type":"Researcher","foaf:name":[{"@value":"Service des Recherches Métallurgiques Appliquées (SRMA) ; Département des Matériaux pour le Nucléaire (DMN) ; CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)) ; Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)) ; Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay"}]},{"@id":"https://cir.nii.ac.jp/crid/1892835442535731341","@type":"Researcher","foaf:name":[{"@value":"Dipartimento di Scienza dei Materiali = Department of Materials Science [Milano-Bicocca] ; Università degli Studi di Milano-Bicocca = University of Milano-Bicocca (UNIMIB)"}]},{"@id":"https://cir.nii.ac.jp/crid/1892835442535731338","@type":"Researcher","foaf:name":[{"@value":"Faculty of Science and Engineering, Hosei University ; Hosei University [Chiyoda]"}]},{"@id":"https://cir.nii.ac.jp/crid/1892835442535731332","@type":"Researcher","foaf:name":[{"@value":"Dipartimento di Scienza dei Materiali = Department of Materials Science [Milano-Bicocca] ; Università degli Studi di Milano-Bicocca [Milano] (UNIMIB)"}]},{"@id":"https://cir.nii.ac.jp/crid/1892835442535731340","@type":"Researcher","foaf:name":[{"@value":"CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)) ; Commissariat à l'énergie atomique et aux énergies alternatives (CEA)"}]},{"@id":"https://cir.nii.ac.jp/crid/1892835442535731328","@type":"Researcher","foaf:name":[{"@value":"Faculty of Science and Engineering, Hosei University ; Hosei University"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00218979"},{"@type":"EISSN","@value":"10897550"}],"prism:publicationName":[{"@value":"Journal of Applied Physics"}],"dc:publisher":[{"@value":"AIP Publishing"}],"prism:publicationDate":"2017-04-17","prism:volume":"121","prism:number":"15","prism:startingPage":"153101"},"reviewed":"false","url":[{"@id":"https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.4980111/13374356/153101_1_online.pdf"}],"createdAt":"2017-04-17","modifiedAt":"2023-08-06","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=Physics%20and%20Astronomy%20(all)","dc:title":"Physics and Astronomy (all)"},{"@id":"https://cir.nii.ac.jp/all?q=%5BPHYS.NUCL%5DPhysics%20%5Bphysics%5D/Nuclear%20Theory%20%5Bnucl-th%5D","dc:title":"[PHYS.NUCL]Physics [physics]/Nuclear Theory [nucl-th]"},{"@id":"https://cir.nii.ac.jp/all?q=sapphire","dc:title":"sapphire"},{"@id":"https://cir.nii.ac.jp/all?q=Cathodo-luminescence","dc:title":"Cathodo-luminescence"},{"@id":"https://cir.nii.ac.jp/all?q=%5BPHYS.NEXP%5DPhysics%20%5Bphysics%5D/Nuclear%20Experiment%20%5Bnucl-ex%5D","dc:title":"[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]"}],"relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360302865557321216","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Virtual photon approach of cathodoluminescence and ion-beam induced luminescence of solids"}]},{"@id":"https://cir.nii.ac.jp/crid/1360848657218254976","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Cathodoluminescence induced in oxides by high-energy electrons: Effects of beam flux, electron energy, and temperature"}]},{"@id":"https://cir.nii.ac.jp/crid/1360853567611960576","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Cathodoluminescence of cerium dioxide: Combined effects of the electron beam energy and sample temperature"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.4980111"},{"@type":"OPENAIRE","@value":"doi_dedup___::68cb7ff1718d416b7369e248da05dc88"},{"@type":"CROSSREF","@value":"10.1088/1361-648x/accb34_references_DOI_HOcZTsqR35nk4qI91QQOK3nFVgi"},{"@type":"CROSSREF","@value":"10.1016/j.jlumin.2020.117379_references_DOI_HOcZTsqR35nk4qI91QQOK3nFVgi"},{"@type":"CROSSREF","@value":"10.1016/j.jlumin.2018.12.045_references_DOI_HOcZTsqR35nk4qI91QQOK3nFVgi"}]}