Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
G. Vergara and L. J. Gómez and J. Presa and M. T. Montojo,Electron diffusion length and escape probability measurements for <i>p</i>-type GaAs(100) epitaxies,"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films",0734-2101,American Vacuum Society,1990-09-01,8,5,3676-3681,https://cir.nii.ac.jp/crid/1363107368422060288,https://doi.org/10.1116/1.576479