著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Eric N. Landis and Denis T. Keane,X-ray microtomography,Materials Characterization,1044-5803,Elsevier BV,2010-12,61,12,1305-1316,https://cir.nii.ac.jp/crid/1363107369183246592,https://doi.org/10.1016/j.matchar.2010.09.012