著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Tobias Pfeiffer and Stefan Weber and Jens Klier and Sebastian Bachtler and Daniel Molter and Joachim Jonuscheit and Georg Von Freymann,Terahertz thickness determination with interferometric vibration correction for industrial applications,Optics Express,1094-4087,Optica Publishing Group,2018-05-02,26,10,12558,https://cir.nii.ac.jp/crid/1363107370274165888,https://doi.org/10.1364/oe.26.012558